LogicVision adds 'built-in repair analysis'

LogicVision adds 'built-in repair analysis'
SANTA CRUZ, Calif. — Introducing a new capability for its IC memory Built-In Self Test (BIST) products, LogicVision Inc. is rolling out "built-in repair analysis" (BIRA) support. LogicVision worked with Mosys, Inc. to test the new capability with Mosys' 1T-SRAM family of embedded memories.

The BIRA capability it touted as helping users improve yields by repairing memories without the additional costs of external failure data collection schemes. It's performed concurrently with BIST and incurs no additional test time beyond what's needed to test the memory, according to LogicVision.

Specifically, BIRA provides a more efficient way of generating memory repair instructions, or fuse maps. Traditionally, memory failure data must be extracted and analyzed off-line to determine the repair instructions. The BIRA capability removes that need, and can support both fuse-based (hard) and register based (soft) memory reconfiguration schemes.

BIRA is part of the LogicVision SoC embedded test solution and is supported in several products, including icBIST, icDEBUG and icMFG.