Memory BIST tool runs at full speed

Memory BIST tool runs at full speed
SANTA CRUZ, Calif. — Claiming to have the first memory built-in self test (BIST) tool that provides both full-speed and fault-accumulative testing, engineering services provider Comit Inc. has released its Fiesta CMBT Memory BIST product. The company claims the tool can improve yields and help achieve up to a 50 percent reduction in test and repair costs.

Embedded memory BIST logic identifies memory failures, determines whether the memory is repairable, and generates a repair fuse map to indicate failed memory locations. By testing IT-SRAM embedded memories at real-time access speeds, the Fiesta CMBT solution ensures accurate identification of SoC devices that might fail in the field, Comit claims.

Full-speed testing examines embedded memory with both the clock speed and access times in real-life values. Fault-accumulative testing offers fault-data retention over multiple test passes at varying voltages and temperatures. Fiesta CMBT also provides programmable test data patterns, and claims to support all types of read/write latencies.

Comit is a provider of outsourced engineering services. The company worked with MoSys Inc., a provider of high-density embedded memory solutions, to create the new tool. The Fiesta CMBT Memory BIST tool is available now on Unix, Linux and Windows platforms.