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Modern embedded and computing systems have become progressively more powerful by incorporating high-speed buses, industry standard subsystems, and more integrated functionality in chips. They have also become more complex, more sensitive to signal quality, and more time consuming to troubleshoot. While standards exist for many technologies commonly used within high performance digital systems, a major test requirement is to ensure that all elements are synchronized and perform as a seamless, integrated whole. This application note discusses testing and tools that enable evaluation of not only a single element, but also an entire system.





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