Tech Papers

Serial Bus Revolution Demands Testing Evolution

LeCroy
Matthew Dunn

Technology Paper

November 2005

External URL
As more systems become partitioned using high speed serial busses there is a danger that major parts of the system will simply not be tested appropriately. Inappropriate testing in the name of reusing old technology could be the most costly mistake in new product development. This paper examines the testing paradigm for serial bus based architectures. The assertion is to avoid the common mistake that it makes sense to reuse test code designed for parallel systems on a serial bus system.





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