Time Domain Susceptibility of Optoelectronic Materials — GaAs

Online Symposium for Electronics Engineers (OSEE)

M.E. Thomas et al.

Conference Paper

October 2007

This paper reviews the frequency domain characterization of the complex index of refraction of GaAs at room temperature. Experimental data is compared to the classical oscillator model in the infrared and to the Adachi models in the near-IR to UV.

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