An Investigation On The Stress-Induced Instabilities in High Power Thyristor Devices

Online Symposium for Electronics Engineers (OSEE)

S.K. Premachandran and K.P. Raghunath

Conference Paper

October 2007

This paper discusses the identification of root causes of instabilities observed in leakage currents under voltage and temperature stress, and the development of an alternate process technology solution.

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