Design Article
Driving Large-Die and Paralleled Power MOSFETs Is Easy with the Right Techniques
Ken Dierberger
3/28/2000 12:00 AM EST
Today's electronics systems require lower voltages, higher currents, higher power density, and higher efficiency than their predecessors needed. These demands necessitate the use of paralleled power MOSFETs or large-die MOSFETs. Having to use these high capacitance devices has given some designers an uneasy feeling about which approach to use.
The successful design of robust gate-drive circuitry for high voltage, very high current MOSFETs is no different than the driver circuitry designed for smaller devices. It depends on an understanding of the drive requirements, a good model to predict the results, careful attention to the physical layout of the driver board, and the selection of the proper circuit topology.
Figure 1 represents a generic gate driver circuit where the switching speed is controlled by the total gate impedance (RG), the total source inductance (LS), the load resistance, and the device's characteristics. Once the load is defined and the power-switching device is selected, the fast switching speed is achieved by minimizing the two remaining parameters, RG and LS.
Figure 1: A generic gate driver circuit where the switching speed is controlled by the total gate impedance (RG), the total source inductance (LS), the load resistance, and the device's characteristics.
Although this article discusses a single MOSFET device, the equations can be extended to paralleled devices by adding together the parameters of the paralleled combination and treating the paralleled devices as a single lumped device.
Turn-On Breaks Down into Three Intervals
The resistive load turn-on waveforms of a power MOSFET (Figure 2) can be divided into three intervals. In the first interval, the gate voltage rises to a value where the device just begins to conduct. This interval is controlled by the device's input capacitance and input impedance. The second interval is the time it takes the drain voltage to reach its minimum and the drain current to reach its maximum. The input impedance, gate-drain and gate-source capacitances, source inductance, GM of the device, and load current, control this interval. This period is the most complex and represents the turn-on power losses. The third interval is the period it takes the gate voltage to complete its rise to the gate drive supply voltage and is controlled by the input impedance and the input capacitance.
Figure 2: The resistive load turn-on waveforms of a power MOSFET
Interval One (t0 t1)
This period begins with the transition of the input voltage (VIN) from the low value of the gate drive voltage (VGG) to the high value of the gate drive voltage (VGG) and ends when the gate voltage reaches a value where drain current begins to flow (VGS(ON)). For this analysis, the VIN transition is defined as a step function that occurs in zero time. Because no drain current flows during this period, the drain voltage remains at the supply voltage (VDD).
The equivalent circuit for this period (shown in Figure 3) is a simple RC network made up of the input impedance (RG) and the input capacitance (CISS) and is the sum of the driver impedance, the gate resistor, and the internal gate impedance.
Figure 3: The equivalent circuit for Interval One
The time of the period and the waveform can be calculated from the RC time constant formula:
(1)
Solving Equation 1 for t:
(2)
Where delta VGG is the total voltage swing of VIN.
From Equation 2, the device in Figure 1 would have a first interval of:
Where CISS is the typical value from the data sheet and VGS(ON) is from the transfer characteristic curve on the data sheet.
Interval Two (t1 t2)
This period begins when drain current starts to flow at the end of interval one and ends when the drain current (ID) reaches its maximum value. A gate-voltage plateau marks this period. The gate drain capacitance CGD in conjunction with the falling drain voltage, known as the Miller Effect, cause this plateau.
Reading some papers on MOSFET gate-drive and switching performance could lead you to believe that the rise time of the drain current lasts for the same time as the gate voltage is exhibiting the Miller Effect. The following analysis will show this is untrue.
Using Kirchoff's Law, an approximate equation for the gate node (when the rate of change of VGS is much less than the rate of change of VDS) is:
(3)
Solving Equation 3 for dt:
(4)
The change in gate voltage is related to the change in drain voltage by:
(5)
Combining Equations 4 and 5:
(6)
Also:
(7)
And the drain current's rate of change is related to the drain voltage's rate of change by:
(8)
Combining Equations 6, 7, and 8:
(9)
Solving Equation 9 for dt:
(10)
The solution of Equation 10 is not straightforward because CGD is voltage dependent and varies as a function of the drain-source voltage and GM is a function of the drain current. An incremental solution for Equation 10 can be accomplished using a spreadsheet and 25V incremental values for dVDS. An example of this technique can be found in the downloadable spreadsheet.
Interval Three (t2 t3)
This period begins when ID reaches its maximum value and ends when CISS is fully charged. Like the first period, the equivalent circuit is an RC network made up of RG and CISS. The time of the period and the waveform can again be calculated from the RC time constant formula in Equation 2. However, the value for CISS is much larger than in the first interval because the drain-source voltage is much lower. This interval is not of major concern because all activity with the drain voltage and current has been completed before this interval starts.
Turn-Off
The resistive load turn-off waveforms of a power MOSFET (Figure 4) can also be divided into three intervals. The equations for calculating the periods and waveforms are simply the reverse of the turn-on where interval one corresponds to interval three, interval two still corresponds to interval two, and interval three corresponds to interval one.
Figure 4: The resistive load turn-off waveforms of a power MOSFET
Figures 5 and 6 show actual switching waveforms from an APT5O2OBN power MOSFET switching a 10.5ohm load at 250V with 51ohm gate resistors. RD is 4ohms and R1 is 3ohms. The calculated switching waveforms are overlaid with dots. The correlation between calculated and measured values is very good, proving the validity of Equations 2 and 10.
Figures 5 and 6: Actual switching waveforms from an APT5O2OBN power MOSFET
Layout Considerations
As demonstrated, switching a MOSFET on and off requires only a simple circuit to charge and discharge the device's input capacitance. However, this seemingly simple circuit is not without problems and pitfalls. It is simple only when compared to bipolar drives.
Problems most often encountered with the gate drive circuit include:
- Voltage spikes large enough to rupture the gate oxide
- Oscillation
- Ringing or false turn-on.
Usually, these problems are the fault of the layout and not the driver circuit's electrical design. To minimize these problems, the following design rules and precautions should be followed when designing and laying out driver circuits.
As illustrated in the previous section, the source inductance plays a significant role in the switching speed by acting as a negative feedback to the gate drive. Engineers cannot reduce the source inductance in the device's package (LS), but the inductance relating to the connecting circuitry (LC) can be mitigated. Where the gate signal and the load current share the same conduction paths (Figure 1) is the problem section. Therefore, the load current should be diverted from the gate signal's path as soon as possible — the closer to the source terminal of the device the better.
Connecting the gate driver return to ground, instead of Point A in Figure 1, adds the inductor LC to the LS term of the switching speed (Equation 10) causing the switching time to increase. Each additional inch of circuitry will add as much as 20nH. Adding 20nH to the switching speed calculation changes the results from a 20ns rise time to a 70ns rise time, a 350% increase.
A ground loop is an often-overlooked mistake in the gate driver circuitry layout. A ground loop occurs when the gate driver circuitry is tied to the power ground in more than one place, resulting in load current flowing in the gate driver ground (Figure 7). This current not only results in slower switching speeds, but also can cause excessive ringing on the gate, false triggering of the power device, and oscillations.
Figure 7: Example of a ground loop
Minimizing the area of the gate driver circuitry loop, as Figure 8 shows, reduces the inductance in the loop and lowers the driver impedance.
Figure 8: Minimized area of the gate driver circuitry loop
A ground plane under the gate driver circuitry is helpful in reducing noise injection into the drive circuitry. However, the ground plane should be tied only to the power ground at Point A in Figure 1. Great care should be taken not to create ground loops by multiple tie points to the power ground. For a high side driver, the ground plane should tie to the source of the high side device, not to the power ground.
Do not intermix gate driver circuitry and high current carrying load circuitry. Noise can be coupled into the gate driver circuitry through stray capacitance or induced by radiated fields. The results of the injected noise could cause excessive ringing on the gate, false triggering of the power device, or oscillations.
The gate driver power supply should be bypassed with good quality, high frequency capacitors because the power supply's impedance is a part of the driver impedance (RG). The capacitors should be connected as close as possible to the driver to minimize the inductance.
Gate Drivers
To this point, the type of driver being used has not been indicated; only that it represented 4ohms of the total gate drive impedance (RG). Once the source inductance is under control through proper layout, it is clear from the model in Figure 1 that the next way to improve switching speed is to reduce the driver's resistance. Selection of the proper gate-driver circuit topology accomplishes this task.
Gate drivers can be divided into two categories: discrete and IC. In the past, discrete drivers have dominated, but IC types are increasingly used because of their improved performance and lower prices. I favor the IC driver over the discrete driver because it uses fewer components, making the optimal layout easier to achieve.
Discrete Drivers
Two types of discrete drivers are in common use: the complimentary pair, bipolar NPN-PNP emitter-follower (Figure 9a) and the complimentary pair MOSFET P-channel N-channel (Figure 9b). Both types are referred to as totem poles.
Figure 9: (a) The complimentary pair, bipolar NPN-PNP
emitter-follower discrete driver.
(b) The complimentary pair MOSFET P-channel N-channel discrete
driver.
The bipolar totem pole is non-inverting and offers no voltage gain to improve the pre-driver rise or fall times. It does provide current gain to reduce the driver impedance to speed the charge and discharge of the device capacitances. Once the input capacitances are charged and the power device has been switched, the driver does not require holding current. It offers medium speed and does not perform well at higher conversion frequencies.
To facilitate higher frequency operation and faster switching, the P- and N-channel complimentary pair MOSFET driver is used. Unlike the bipolar design, the MOSFET totem pole is inverting and offers voltage gain to improve on the pre-driver rise and fall times. This driver suffers from shoot-through current caused by the threshold voltage overlap during on and off transitions resulting in increased drive power requirements. Because of the inverting nature of the driver, it may cause false turn-on of the power device during power up and power down, requiring under voltage detection and hold-off circuitry.
IC Drivers
In the past, several companies introduced IC drivers with reasonable performance and a relatively high cost. Recently these and other companies have continued to improve the performance and reduce the cost of the IC driver, making them more cost competitive with the discrete driver. The IC driver is a better solution when the fact it requires fewer total components is considered, making it easier to meet layout design rules.
Driver Comparison
Table 1 shows a comparison between the two discrete drivers and several IC drivers driving an APT5O2OBN device (0.2ohms, 28A, 500V) switching a 10.5ohm load, 250V with no gate resistor RG. Shown in the table, several of the IC drivers equal the MOSFET totem pole and the remainder range between the MOSFET and bipolar totem pole drivers.
Table 1
| Driver | Rise Time (ns) | Fall Time (ns) |
| MOS | 20 | 20 |
| UC3710 | 20 | 20 |
| M1C4451 | 20 | 20 |
| M1C4429 | 30 | 30 |
| UC3708 | 30 | 30 |
| UC3711 | 30 | 40 |
| Bipolar | 60 | 70 |
Driving Large Die
To this point we have been examining the APT5O2OBN, a relatively large device. However, there are even larger devices in use such as the APT5OM6OJN (0.06ohm, 71A, 500V). This device was switched with a 3.5ohm load, 250V with 0, 1.5, and 3ohms gate resistor RG. The gate resistors were added to control excess ringing caused by inductance in the load on the three faster devices. The APT5OMGOJN is four times as large as the APT5O2OBN and it would seem to present a much more difficult gate drive problem. However, Table 2 shows that if the layout design rules are adhered to as previously discussed, driving this device is not much more difficult than driving the smaller device.
Table 2
| Driver | RG (ohm) | Rise Time (ns) | Fall Time (ns) |
| MOS | 0 | 20 | 20 |
| 4451 | 0 | 20 | 20 |
| 3710 | 0 | 30 | 40 |
| 3711 | 0 | 40 | 50 |
| 4451 | 1.5 | 40 | 70 |
| 4451 | 3.0 | 60 | 100 |
The successful design of a MOSFET gate driver not only depends on the selection of a low-impedance driver circuit topology but also strongly depends on the layout of the circuit board containing the driver circuit.
If a low-impedance driver circuit is employed and proper attention is given to the layout, fast switching of large die MOSFETs is not more difficult than driving smaller devices.



